HIGH-RESOLUTION IMAGING AND PROCESSING METHOD AND

专利名称：HIGH-RESOLUTION IMAGING AND

PROCESSING METHOD AND SYSTEM FORINCREASING THE RANGE OF A GEOMETRICDIMENSION OF A PART THAT CAN BEDETERMINED

发明人：Christopher C. Fleming,Michael G. Nygaard申请号：US13972194申请日：20130821

公开号：US20150055145A1公开日：20150226

专利附图：

摘要：A high-resolution imaging and processing method and system for increasing therange of a geometric dimension of a part that can be determined are provided. Themethod includes directing at least one plane of collimated radiation at a surface of thepart. Each of the planes is occluded by the part to create unobstructed first and secondplanar portions of the plane of radiation. Each of the first and second planar portions hasa width and contains an amount of radiation which is representative of a respectivegeometric dimension of the supported part to be determined. The method includesincreasing the width and decreasing the intensity of the first and second planar portionsimaged on a plurality of predetermined measuring areas to obtain respective elongatedplanar portions and to produce respective electrical signals. The electrical signals areprocessed to determine the geometric dimension with enhanced accuracy.

申请人：GII Acquisition, LLC dba General Inspection, LLC

地址：Davisburg MI US

国籍：US

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