Calibration method and apparatus for flat product

专利名称：Calibration method and apparatus for flat

product transversal profile thicknessmeasuring unit

发明人：CAMPAS, JEAN-JACQUES申请号：EP94470011.1申请日：19940408公开号：EP0622610B1公开日：19980121

摘要：The device is intended for the calibration of a system for measuring thethickness profile of flat products, for example metal sheets, which includes a radiationsource (10), for example an X-ray source, and a row (20) of elementary detectors (21)aligned in the direction (P) of the profile to be measured, these being placed on eitherside of a zone (2) through which the said product passes. The device includes a set (32) ofshims (33) having different characteristics, and a carriage (30) for supporting the shimswhich move in this direction. In order to carry out the calibration, the set of shims ismoved in the passage zone so that each shim can intercept the radiation emitted by thesource in the direction of each detector and, as the carriage moves, several readings aremade of the signals emitted by the detectors so as to obtain, for each detector, a set ofvalues of the signals representative of the intensity of the radiation absorbed by eachshim, and, from these values, the calibration curve of each sensor is obtained.

申请人：SOLLAC S.A.,LORRAINE LAMINAGE,SOLLAC S.A.

地址：FR

国籍：FR

代理机构：Ventavoli, Roger

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