Scan test expansion module

专利名称：Scan test expansion module发明人：Kevin J. Gearhardt,Douglas J. Feist申请号：US11116616申请日：20050428公开号：US07240264B2公开日：20070703

专利附图：

摘要：An external scan test module that is adapted to act as an interface between anautomated tester and a device under test. The external scan test module includes a scanpattern memory to hold scan patterns for at least one configuration of the device undertest. A failure log memory holds failure information for the device under test. A

controller sends scan input data to the device under test, receives scan output data fromthe device under test, and sends and receives signals from the automated tester. Aninterface receives scan patterns.

申请人：Kevin J. Gearhardt,Douglas J. Feist

地址：Fort Collins CO US,Fort Collins CO US

国籍：US,US

代理机构：Luedeka, Neely & Graham, P.C.

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