STORAGE SYSTEM AND TEST METHOD FOR TESTING PCI EXP

专利名称：STORAGE SYSTEM AND TEST METHOD FOR

TESTING PCI EXPRESS INTERFACE

发明人：Xue-Qin HE申请号：US14485607申请日：20140912

公开号：US20160077942A1公开日：20160317

专利附图：

摘要：Provided is a storage system and a test method for a testing PeripheralComponent Interconnect Express (PCI Express) interface. The storage system of thepresent invention includes a plurality of DMA memory units storing test data, a data

processing unit connected to the plurality of DMA memory units, wherein a

predetermined amount of data is transmitted at least once from a first processing (suchas an SAS control chip) to the plurality of DMA memory units through a PCI Expressinterface and the data processing unit, transmission information is generated andrecorded during data transmission, and the transmission information is outputted by thedata processing unit while data transmission is completed or an interrupt is generateddue to an error occurred during data transmission, and a test unit testing the PCI Expressinterface based on the transmission information outputted by the data processing unit.

申请人：Celestica Technology Consultancy (Shanghai) Co., Ltd.

地址：Shanghai CN

国籍：CN

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